Autori: M.E. Koleva, S. Zotova, P.A. Atanasova, R.I. Tomova, C. Ristoscu, V. Nelea, C. Chiritescu, E. Gyorgy, C. Ghica, I.N. Mihailescu

Editorial: Applied Surface Science, 168, p.108 - 113, 2000.

Rezumat:

High-quality epitaxial strontium-hexaferrite (SrFe12O19) thin films were grown by pulsed laser deposition (PLD) on c-cut sapphire using KrF* excimer laser at a frequency of 2 J/cm2 and substrate temperature of 8008C in 100 mTorr oxygen environment. The X-ray diffraction (XRD) and morphology analyzes showed films with excellent crystalline structure and flat
surface. The thickness was found to influence considerably the surface morphology and magnetic properties of the as-deposited films. The highest orientation and the best morphology with smooth surface and fine grain structure was obtained for the film having a thickness of 750 nm. The highest coercive force of 1453 Oe was measured for this film in perpendicular to the plane direction.

Cuvinte cheie: applied physics and chemistry of surfaces and interfaces