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Autori: C. Harnagea and A. Pignolet
Editorial: A. Gruverman and M. Alexe, Springer - Verlag, Nanoscale characterisation of ferroelectric materials; Scanning probe microscopy approach, p.45-85, 2004.
The piezoresponse technique is based on the detection of local vibrations of a cantilever induced by a testing AC signal applied between the conductive tip of the scanning force microscope (SFM) and the bottom electrode of a ferroelectric sample. The cantilever vibrations are converted into an electrical signal by the position sensitive detector of the SFM and extracted from the global deflection signal using a standard lock-in technique. This electrical signal representing the cantilever vibrations is further referred to as PiezoResponse Signal (PRS), for reasons that will be explained later.
There is some controversy in the literature concerning the origin of the induced cantilever vibrations. The scenario initially proposed was…
Cuvinte cheie: Scanning force microscopy, ferroelectric domains and hysteresis, local electromechanical characterization, piezoelectric tensor