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The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

Domenii publicaţii > Fizica + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: M. Enachescu, R.W. Carpick, D.F. Ogletree and M. Salmeron

Editorial: J. App. Phys., 95, p.7694, 2004.

Rezumat:

Cuvinte cheie: metals, nanocontacts, nanotribology, adhesion, friction, atomic force microscopy, scanning tunneling microscopy, Pt(111), tungsten carbide, stick-slip, point contact conductance