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Effective Two-Phase Flow Models Including Trapping Effects at the Micro Scale

Domenii publicaţii > Matematica + Tipuri publicaţii > Capitol de carte

Autori: C. J. van Duijn, H. Eichel , R. Helmig, I. S. Pop

Editorial: L.L. Bonilla, M. Moscoso, G. Platero, J.M. Vega, Springer-Verlag Heidelberg, Progress in Industrial Mathematics at ECMI 2006, Mathematics in Industry, 12, p.333-339, 2008.

Rezumat:

Cuvinte cheie: two phase flow, upscaling, interface conditions, trapping

URL: http://www.springerlink.com/content/g2u874/?p=0bfe9ad08aae46dab38ff75b1f31548e&pi=0