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Complementary use of Fourier Transform Laser Microprobe Mass Spectrometry (FT LMMS) and Time-of-Flight Static Secondary Ion Mass Spectrometry (S-SIMS) for the study of the surface adsorption of organic dyes on silicate materials

Domenii publicaţii > Chimie + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: A.M. Busuioc, R. DeMondt, H. Moisio, P. Cool, A. Vasile, N. Bilba, E.F. Vansant

Editorial: John Wiley & Sons Ltd., USA, Rapid Communications in Mass Spectrometry, 19, p.2809, 2005.


The adsorption of organic ionic dyes on different pore size engineered silica materials with potential
application for industrial wastewater treatment has been investigated using Fourier transform
laser microprobe mass spectrometry (FT-LMMS) and time-of-flight secondary ion mass spectrometry
(TOF-S-SIMS). The complementary use of the two methods with different information depth
allowed data on the subsurface distribution and pore penetration of the adsorbed organic compounds.
Macroscopic methods were employed to determine the amount adsorbed on the particles
and the specific external surface area. The observed data open perspectives for the
molecular monitoring of the adsorption behaviour of different materials at the (sub) mm scale.

Cuvinte cheie: spectrometrie de masa // mass spectrometry