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Microstructure of MgB2 samples observed by x-ray microtomography

Domenii publicaţii > Fizica + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: P Badica, G Aldica, T Craciunescu, I Tiseanu, Y Ma and K Togano

Editorial: Superconductor Science and Technology, 21, 2008.

Rezumat:

It is shown that x-ray microtomography (XRT) is a powerful technique to observe on extended
volumes the morphology, alignment and local bulk density in MgB2 tapes, thin films and
especially bulk specimens. For the bulk samples obtained from mechanically milled powders
for different conditions, several types of the 3D microstructural patterns were observed. These
significant differences between the samples were not revealed by SEM. Microtomography can
be a useful additional technique to characterize the samples and to obtain unique information,
e.g. on local bulk density, but it cannot replace the existing methods: advantages and limitations
are discussed. It is concluded that the method is promising and further developments are
expected to be helpful for a better understanding of the complex
processing-microstructure-properties relationship in the MgB2 superconductor.

Cuvinte cheie: X-ray micro-tomography, MgB2, superconductor, milling

URL: http://www.iop.org/EJ/abstract/0953-2048/21/11/115017/