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Chapter 7, Microprocessor system EMC

Domenii publicaţii > Stiinte ingineresti + Tipuri publicaţii > Capitol de carte

Autori: Adascalitei, Adrian A.

Editorial: Electromagnetic Compatibility, Testing and Measurement, Practical Manual, p.93-113, 2002.

Rezumat:

Adascalitei, Ball, Cretu, David, Lever, Montanari, Paede, Salceanu: Electromagnetic Compatibility, Testing and Measurement, Practical Manual, ISBN 0 902683 55 1, July 2002, University of Warwick, United Kingdom, Program DeCQuTest, A Leonardo da Vinci Pilot Project.

Adascalitei, Adrian A.: Chapter 7, Microprocessor system EMC, pp. 93-113;

Immunity level data for certain integrated circuit parts are discussed herein along with analytical techniques for applying the data to electronics systems. This chapter is built heavily on manual produced by McDonnell Douglas Astronautics Company (MDAC, MDC Report El929 of 1 August 1978 entitled Integrated Circuit Electromagnetic Susceptibility Handbook.

Cuvinte cheie: Microprocessor system, Electromagnetic Compatibility, Testiing