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Estimation of polyethylene nanothin layer morphology by differential evanescent light intensity imaging

Domenii publicaţii > Fizica + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: N. Mirchin, M. Gankin, U. Gorodetsky, S.A. Popescu, I. Lapsker, A. Peled, L. Duta, G. Dorcioman, A. Popescu, I.N. Mihailescu

Editorial: Journal of Nanophotonics, 4, p.041760, 2010.

Rezumat:

We investigated the morphology of polyethylene films by the Differential
Evanescent Light Intensity (DELI) imaging method developed by us previously. The films
were prepared by the Matrix Assisted Pulsed Laser Evaporation (MAPLE) technique. Rough
or smooth organic layers were fabricated with thickness depending on the deposition conditions. We used the DELI imaging method here as a fast, low cost method for surface morphology diagnostics of large areas (i.e., hundreds of mm2) of nano layer polyethylene films.

Cuvinte cheie: evanescent wave imaging, nanofilms, polyethylene

URL: http://lspi.inflpr.ro/