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Study of polyethylene nanolayers by evanescent light microscopy

Domenii publicaţii > Fizica + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: S.A Popescu, B. Apter, N. Mirchin, U. Gorodetsky, I. Lapsker, A. Peled, L. Duta, G. Dorcioman, A. Popescu, I.N. Mihailescu

Editorial: Applied Physics A, 104 (3), p.997-1002, 2011.

Rezumat:

Nanometer polyethylene (PE) thin films were
prepared by Matrix Assisted Pulsed Laser Evaporation
(MAPLE). Insulating PE thin films of different thicknesses,
below 200 nm, were fabricated by varying the deposition
conditions. We then used the Differential Evanescent Light
Intensity (DELI) microscopy technique for thickness profiles
investigation of the PE nanolayers together with AFM
measurements for calibration. A phenomenological model for the interaction between the evanescent waves and the deposited material and simulations of the nanofilms evanescent light scattering using the Maxwell equation solver Full-WAVE are presented.

Cuvinte cheie: Nanometer polyethylene, Matrix Assisted Pulsed Laser Evaporation (MAPLE), DELI microscopy technique

URL: http://lspi.inflpr.ro/