Scopul nostru este sprijinirea şi promovarea cercetării ştiinţifice şi facilitarea comunicării între cercetătorii români din întreaga lume.
INFLPR, Magurele, .
E-mail: trimite un mesaj.
Pagina web a instituţiei: http://www.inflpr.ro/
Pagina web personala: http://ila.inflpr.ro/
Nascut(a) in: 1968
Interese: scaterometrie, analiza de erori, interferometrie, elipsometrie, optica Fourier, holografie
Details:
Nov 1992 - Aug 1996, National Institute of Laser, Plasma and Radiation Physics (INFLPR), Bucharest, Romania:
- research assistant, researcher
- sensitivity optimization of reflectometric methods for determining the optical constants of metals, development of the Jacobian formalism
Aug 1996 - Aug 2000, University of New Mexico/ Center for High Technology Materials (CHTM), Albuquerque, NM
- teaching assistant, research assistant
- sensitivity-optimized scatterometry, development of the Sensitivity Analysis for Fitting formalism, ellipsometric and phase-modulation scatterometry
Aug 2000 - Oct 2003 University of New Mexico/ Center for High Technology Materials (CHTM), Albuquerque, NM
- post-doctorate fellow, principal investigator
study of the impact of grating anomalies on scatterometry sensitivity, UV scatterometry
Dec 2003 -
National Institute of Laser, Plasma and Radiation Physics (INFLPR), Bucharest, Romania:
-researcher, senior researcher
Publicații selectate:
* P.C. Logofatu, D. Apostol, V. Damian and R. Tumbar, Determination of optical constants of metal by near grazing incidence reflectivity measurements, Infrared Physics & Technology, 37(3), 1996.
* D. Apostol, P.C. Logofãtu, V. Damian and A. Dobroiu, Sensitivity analysis of parameter determination from measurements of directly measurable quantities using the Jacobian, Optical Engineering, 35(5), 1996.
* P.C. Logofãtu, D. Apostol, V. Damian and R. Tumbar, Ambiguities in determining the optical constants for two reflection methods, Applied Optics, 35(1), 1996.
* P.C. Logofãtu, D. Apostol, V. Damian and R. Tumbar, Optimum angles for determining the optical constants from reflectivity measurements, Meas. Sci. Technol., 7(1), 1996.
* A. Dobroiu, P.C. Logofatu, D. Apostol and V. Damian, Statistical self-calibrating algorithm for three-sample phase-shift interferometry, Meas. Sci. Technol., 8(7), 1997.
* P.C. Logofatu, S. A. Coulombe, B. K. Minhas and J. R. McNeil, Identity of the cross reflection coefficients for symmetric surface-relief gratings, J. Opt. Soc. Am. A, 16(5), 1999.
* P.C. Logofatu, Analysis of phase measurement error for null generalized ellipsometry using the phase compensator, J. Optoelectron. Adv. M., 3(1), 2001.
* A.K. Sharma, S.H. Zaidi, P.C. Logofatu and S.R.J. Brueck, Optical and electrical properties of nanostructured metal-silicon-metal photodetectors, IEEE J. Quantum Elect., 38, 2002.
* P.C. Logofatu, Simple method for determining the fast axis of a wave plate, Optical Engineering, 41, 2002.
* P.C. Logofatu, Sensitivity analysis of grating parameter estimation, Applied Optics, 41, 2002.
* P.C. Logofatu, Phase-modulation scatterometry, Applied Optics, 41, 2002.
* P.C. Logofatu, D. Apostol, V. Damian, I. Iordache, M. Bojan, R. Muller, Abeles method revisited, Applied Optics, 45, 2006.
* D. Apostol, P.C. Logofatu, S. Florea, V. Damian, I. Iordache, M. Bojan, Accurate calibration of grating pitch, M. A. Popescu, J. Optoelectron. Adv. M., 10, 2008.
* P.C. Logofatu, D. Apostol, Fully statistical approach for regression analysis, Measurement, 41, 2008.
* P.C. Logofatu, I. Ardelean, D. Apostol, I. Iordache, M. Bojan, C. Moisescu, B. Ionita, Determination of the magnetic moment and geometrical dimensions of the magnetotactic bacteria using an optical scattering method, Journal of Applied Physics, 103, 2008.
* M. Rosu, B. Ionita, D. Apostol, F. Garoi, P. C. Logofatu, Histogram equalization and specification in interferometry, M. A. Popescu, Optoelectronics and Advanced Materials – Rapid Communications, 3, 2009.
* V. Nascov, P.C. Logofatu, Fast computation algorithm for the Rayleigh-Sommerfeld diffraction formula using a type of scaled convolution, Applied Optics, 48, 2009.
* P. C. Logofatu, D. Apostol, The Fourier transform in optics: from continuous to discrete or from analogous experiment to digital calculus, J. Optoelectron. Adv. M., 9, 2007.
* A. K. Sharma, P. C. Logofatu, C. S. Mayberry, S. R. J. Brueck and N. E. Islam, Effects of dimensional nanoscaling on the optical and electrical properties of crystalline Si thin films, Journal of Applied Physics, 101, 2007.