Scopul nostru este sprijinirea şi promovarea cercetării ştiinţifice şi facilitarea comunicării între cercetătorii români din întreaga lume.
Autori: L. Sirghi, F. Rossi
Editorial: Appl. Phys. Lett., 89, p.243118, 2006.
The present work proposes an extension of Oliver-Pharr analysis (J. Mater. Res. 7, 1564, 1992) of unloading force-displacement data obtained in nanoscale indentation experiments to account for contact adhesion. The loading force is considered a sum of the contact elastic and adhesion forces.
During the unloading, both forces suffer variations. For conical geometry, the unloading
force-displacement curve is described by a sum of a quadratic term accounting for the elastic force
and a linear term accounting for adhesive force. Results of atomic force microscopy indentation
experiments performed with sharpened silicon tips on polydimethylsiloxane agreed well with the
prediction of the proposed theoretical model.
Cuvinte cheie: nanoscale indentation, AFM, adhesive force, elastic force