Scopul nostru este sprijinirea şi promovarea cercetării ştiinţifice şi facilitarea comunicării între cercetătorii români din întreaga lume.
Institutul National de Cercetare Dezvoltare in Microtehnologie, Bucuresti, .
E-mail: trimite un mesaj.
Pagina web a instituţiei: http://www.imt.ro
Nascut(a) in: 1948
Interese: semicodnuctoare, fiabilitate, microsisteme
Detalii:
Dr. Marius Bazu, Sef al Laboratorului de Fiabilitate din IMT-Bucharest, cu preocupari recente in fiabilitatea microsistemelor, si ingineria convergenta. Autor a doua carti publicate de Artech House (2009) si Springer Verlag (1999) si a peste 100 de articole si comunicari in reviste (IEEE Trans.on Reliability, Journal of Electrochem. Soc, Solid State Phenomena, etc.) si la conferintele importante de fiabilitate (Annual Reliability and Maintainability Symp., Probabilistic Safety Assessment and Management, ESREL, etc.). Lider al "cluster"-ului de Fiabilitate al NoE "Patent-DfMM" (proiect european PC6 /IST, 2004-2007) si referent al revistelor IEEE Transactions on Reliability, IEEE Transactions on Components and Packaging, IEEE Electron Device Letters, MIcroelectronics Reliability si Sensors.
Details:
Dr. Marius Bazu, Head of the Reliability Laboratory of IMT-Bucharest, with recent research interests in microsystem reliability and concurrent engineering. Author of two books published by Artech House (2009)and Springer Verlag (1999) and of more than 100 papers and contributions in journals (IEEE Trans.on Reliability, Journal of Electrochem. Soc, Solid State Phenomena, etc.) and to major reliability conferences (Annual Reliability and Maintainability Symp., Probabilistic Safety Assessment and Management, ESREL, etc.). Leader of the Reliability Cluster of NoE "Patent-DfMM" (European project FP6/IST, 2004-2007) and referent of the journals IEEE Transactions on Reliability, IEEE Transactions on Components and Packaging, IEEE Electron Device Letters, MIcroelectronics Reliability and Sensors.
Publicații selectate:
* Titu Bajenescu, Marius Bazu, Reliability Components for Electronic Systems, Artech House, 2009.
* Titu Bajenescu, Marius Bazu, Reliability of Electronic Components, Springer Verlag, 1999.