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Fundamental Aspects of Exchange Bias Effect

Domenii publicaţii > Fizica + Tipuri publicaţii > Tezã de doctorat (nepublicatã)

Autori: Florin Radu

Editorial: -, -, p.235, 2005.


This thesis is organized in three parts: „Fundamentals of Exchange Bias”, „Polarized Neutron Reflectometry”, and „Exchange Bias in CoO/Ferromagnet Bilayers and Multilayers”. In the first part, some of the current models for exchange bias are reviewed and a new model is developed. In the second part of the thesis some fundamental aspects of polarized neutron reflectometry and its applications to magnetic thin films and heterostructures are described. The third part containes experimental results on Co/CoO bilayers, Co/CoO multilayers and Fe/CoO bilayers. Besides extensive structural and magnetic characterization by X-ray, SQUID, MOKE techniques, advanced characterization methods like PNR and Soft X-ray Resonant Magnetic Scattering (XRMS) were involved in studying the interfacial magnetism of F/AF systems.

Cuvinte cheie: Exchange Bias Effect, Magnetic Thin Films, Polarized Neutron Reflectometry, Soft X-ray Magnetic Scattering