Autori: R. Cristescu , D.E. Mihaiescu, G. Socol, I. Stamatin , I.N. Mihailescu, D.B. Chrisey

Editorial: Applied Physics A, 79, p.1023–1026, 2004.

Rezumat:

We report on the successful deposition of high quality type I fibrilar collagen thin films by Matrix assisted pulsed laser evaporation (MAPLE). Thin films deposition was performed in a N2 ambient (20 Pa) using a KrF* laser source (248 nm, 20 ns) operated at a repetition rate of 3 Hz, the incident laser energy at a value within the range (20-35) mJ, and the laser spot area was (3.5-18.5)±0.1mm2. The collagen films were deposited on double face polished (100) single crystalline Si wafers and characterized by Fourier transform infrared spectroscopy, atomic force microscopy and high resolution transmission electron microscopy. We demonstrate that our thin films are composed of collagen, with no impurities and the roughness can be controlled by the deposition conditions.

Cuvinte cheie: PACS 52.38.Mf; 82.35.Pq; 83.80.Lz