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Abelès method revisited

Domenii publicaţii > Fizica + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: Petre C. Logofatu, Dan Apostol, Victor Damian, Iuliana M. Iordache, Mihaela M. Bojan, and Raluca Müller

Editorial: Applied Optics , Vol. 45, Issue 6, p.pp. 1120-1, 2006.

Rezumat:

The Abelès method is a classical method for determining the refractive index of dielectric thin films. In this paper we examine the main features of the method in a formal manner, using closed-form equations, and we show that the method is ambiguous in certain yet unreported situations.

Cuvinte cheie: instrumentation, measurement, and metrology : Optical constants,Thin films : Thin films, optical properties