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Autori: G. Vitel, A. L. Paraschiv, M. G. Suru, N. Cimpoesu, L.-G. Bujoreanu
Editorial: Optoelectronics and Advanced Materials-Rapid Communications, 5(8), p.858-862, 2011.
Temperature memory effect (TME) is usually manifested by a kinetic stop during reverse transformation of thermally
induced martensite to parent phase, after performing an incomplete heating in the previous thermal cycle, applied to a
shape memory alloy (SMA). Technically TME causes the splitting of the endothermic peak corresponding to martensite
reversion, on differential scanning calorimetry (DSC) thermograms. The present paper illustrates new manifestations of
TME on DSC thermographs of hot rolled Cu-Zn-Al SMAs and discusses the accompanying structural changes observed by
optical and scanning electron microscopy.
Cuvinte cheie: Temperature effect, Cu-Zn-Al shape memory alloy, Martensite population, Differential scanning calorimetry, Microstructure