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Structural and optical characterization of thermally oxidized bismuth films

Domenii publicaţii > Fizica + Tipuri publicaţii > Articol în revistã ştiinţificã

Autori: S. Condurache-Bota, G. I. Rusu, N. Þigãu, R. Draşovean, C. Gheorghieş

Editorial: Revue Roumaine de Chimie, 54(3), p.205-211, 2009.


Structural and optical analysis of bismuth oxide thin films was studied. The vacuum thermal evaporation was used to prepare bismuth films onto glass substrates maintained at different temperatures. Subsequently, their thermal oxidation in air was performed for 1 and 2 hours time, respectively. The optical measurements consisted in recording the transmission and reflection spectra of the films at an UV/VIS Spectrometer. The structural characteristics of the films were deduced from the XRD spectra obtained at a DRON 3 diffractometer (Cu-Kα line). The computer-assisted analysis of the optical and XRD spectra allowed the study of the oxidation process and revealed the presence of more than one phase of the bismuth oxide, depending on the temperature of the substrate.

Cuvinte cheie: thin films, bismuth oxide, X-ray Diffraction