Articolele autorului Octavian Buiu
Link la profilul stiintific al lui Octavian Buiu

Extracting the relative dielectric constant for “high-κ layers” from CV measurements – Errors and error propagation

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Real-time observation of charging dynamics in hafnium silicate films using MOS capacitance transients

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Ellipsometric analysis of mixed metal oxides thin films

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