Octavian Buiu

Honeywell Romania SRL, Bucharest, .

E-mail: trimite un mesaj.

Nascut(a) in: 1963

Interese: senzori, nanotehnologie, nanoelectronica, materiale inteligente

Detalii:
- Absolvent al Facultatii de Fizica Bucuresti, sectia Fizica Tehnologica;
- Doctor in Fizica Atomului si Moleculei la Universitatea din Cluj;
- Cercetator stiintific si cercetator stiintific principal la Institutul de Microtehnologie Bucuresti;
- Cercetator stiintific asociat, Research Fellow, lector si sef de lucrari la Universitatea De Montfort, Leicester si Universitatea din Liverpool
- Cercetator stiintific si Portofolio Manager la Honeywell Romania
- Membru al IEEE, SUA si Institutului de Fizica, Londra

Details:
- Graduate of the Physics Faculty, University of Bucharest (1987); PhD in Atomic and Molecular Physics at the University of Cluj (1998)
- Research Scientist and Snr. Research Scientist at the Institute of Microtechnology, Bucharest (1989 - 1997);
- Research Associate, Snr. Research Fellow, lecturer and Snr lecturer at De-Montfort University, Leicester and the University of Liverpool, Liverpool (1997 - 2007)
- Research Scientist and Portfolio manager at the Sensors and Wireless lab, Honeywell Romania
- Member of IEEE Inc, USA (since 1991) and Institute of Physics, UK (since 2000)

Publicații selectate:

* O. Buiu, S. Hall, O. Engstrom, B. Raeissi, M. Lemme, P.K. Hurley, K. Cherkaoui, Extracting the relative dielectric constant for “high-κ layers” from CV measurements – Errors and error propagation, Microelectronics Reliability,, 47, 2007.

* Y. Lu, S. Hall, O. Buiu, J.F. Zhang, Real-time observation of charging dynamics in hafnium silicate films using MOS capacitance transients , Microelectronic Engineering,, 84, 2007.

* O. Buiu, W. Davey, Y. Lu, I.Z. Mitrovic, S. Hall, Ellipsometric analysis of mixed metal oxides thin films, Thin Solid Films, 517, 2008.